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author	Thomas Gleixner <tglx@linutronix.de>
	Fri, 15 Jul 2005 13:53:51 +0000 (14:53 +0100)
committer	Thomas Gleixner <tglx@mtd.linutronix.de>
	Sat, 16 Jul 2005 07:27:52 +0000 (09:27 +0200)
commit	19870da7ea2fc483bf73a189046a430fd9b01391
tree	3f8d07e75dc9895c52c2184d28e3c43a84b0234b	tree \| snapshot
parent	2c4eec9802ae753a4973f0a0d71f8d154e86fd31	commit \| diff

[MTD] NAND: Fix broken bad block scan for 16 bit devices

The previous change to read a single byte from oob breaks the
bad block scan on 16 bit devices, when the byte is on an odd
address. Read the complete oob for now.
Remove the unused arguments from check_short_pattern()
Move the wait for ready function so it is only executed when
consecutive reads happen.

Signed-off-by: Thomas Gleixner <tglx@linutronix.de>

drivers/mtd/nand/nand_base.c		diff \| blob \| history
drivers/mtd/nand/nand_bbt.c		diff \| blob \| history

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